Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy.
We recently reported the analysis of the frequency noise in the frequency modulation atomic force microscopy (FM-AFM) both in high-Q and low-Q environments [Rev. Sci. Instrum. 80, 043708 (2009)]. We showed in the paper that the oscillator noise, the frequency fluctuation of the oscillator, becomes prominent in the modulation frequency lower than f(0)∕2Q, where f(0) and Q are the resonance frequ...
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We have developed a wideband digital frequency detector for high-speed frequency modulation atomic force microscopy (FM-AFM). We used a subtraction-based phase comparator (PC) in a phase-locked loop circuit instead of a commonly used multiplication-based PC, which has enhanced the detection bandwidth to 100 kHz. The quantitative analysis of the noise performance revealed that the internal noise...
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In dynamic atomic force microscopy (AFM) the cantilever is vibrated and its dynamics are monitored to probe the sample with nanoscale and atomic resolution. Amplitude and frequency modulation atomic force microscopy (AM-AFM and FM-AFM) have established themselves as the most powerful methods in the field. Nevertheless, it is still debatable whether one or the other technique is preferred in a g...
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Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift D f of an oscillating cantilever with eigenfrequency f 0 , spring constant k and amplitude A, which is subject to tip-sample forces Fts . Here, we present analytical ...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2011
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.3557416